Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/27772
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dc.contributor.authorTehranipoor, Mohammad-
dc.contributor.authorAhmed, Nisar-
dc.date.accessioned2018-12-05T07:45:15Z-
dc.date.available2018-12-05T07:45:15Z-
dc.date.issued2008-
dc.identifier.isbn978-0-387-76486-3-
dc.identifier.isbn287en_US
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/27772-
dc.language.isoenen_US
dc.publisherSpringer Science+Business Media, LLCen_US
dc.subjectTechnology Designsen_US
dc.subjectHigh Quality Delay Testsen_US
dc.titleNanometer Technology Designs High-Quality Delay Testsen_US
dc.typeBooken_US
Appears in Collections:Electrical and Computer Engineering

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