Please use this identifier to cite or link to this item: 192.168.6.56/handle/123456789/35390
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dc.contributor.author. GARRETT, PATRICK H-
dc.date.accessioned2019-01-15T11:06:41Z-
dc.date.available2019-01-15T11:06:41Z-
dc.date.issued2002-
dc.identifier.isbn0-471-20506-0-
dc.identifier.isbn218en_US
dc.identifier.urihttp://10.6.20.12:80/handle/123456789/35390-
dc.language.isoenen_US
dc.publisherJohn Wiley & Sons, Inc., New York. All rights reserved.en_US
dc.subjectElectrooptical devicesen_US
dc.subjectTesting Congresses.en_US
dc.titleMULTISENSOR INSTRUMENTATION ␴ 6␴ DESIGN Defined Accuracy Computer-Integrated Measurement Systemsen_US
dc.typeBooken_US
Appears in Collections:Electrical and Computer Engineering

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