Please use this identifier to cite or link to this item:
192.168.6.56/handle/123456789/73638Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Werner Zürch, Michael | - |
| dc.date.accessioned | 2019-06-20T09:26:57Z | - |
| dc.date.available | 2019-06-20T09:26:57Z | - |
| dc.date.issued | 2015 | - |
| dc.identifier.isbn | 978-3-319-12388-2 | - |
| dc.identifier.uri | http://10.6.20.12:80/handle/123456789/73638 | - |
| dc.language.iso | en | en_US |
| dc.publisher | Springer | en_US |
| dc.subject | High-Resolution Extreme Ultraviolet Microscopy | en_US |
| dc.title | High-Resolution Extreme Ultraviolet Microscopy | en_US |
| dc.type | Book | en_US |
| Appears in Collections: | Physics | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| 57.pdf.pdf | 7.65 MB | Adobe PDF | View/Open |
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